Journal Article: Seasonal dynamics of fallow and cropping lands in the broadacre cropping region of Australia
Xie, Zunyi, Zhao, Yan, Jiang, Ruizhu, Zhang, Miao, Hammer, Graeme, Chapman, Scott, Brider, Jason and Potgieter, Andries B. (2024). Seasonal dynamics of fallow and cropping lands in the broadacre cropping region of Australia. Remote Sensing of Environment, 305 114070, 1-14. doi: 10.1016/j.rse.2024.114070
Conference Publication: Advances in the study of biochemical, morphological and physiological traits of wheat and sorghum crops in australia using hyperspectral data and machine learning
Potgieter, A. B., Camino, C., Poblete, T., Zhi, X., Reynolds-Massey-Reed, S., Zhao, Y., Belwalkar, A., Ruizhu, J., George-Jaeggli, B., Chapman, S., Jordan, D., Wu, A., Hammer, G. L. and J, Zarco-Tejada P. (2023). Advances in the study of biochemical, morphological and physiological traits of wheat and sorghum crops in australia using hyperspectral data and machine learning. 2023 IEEE International Geoscience and Remote Sensing Symposium, Pasadena, CA USA, 16-21 July 2023. Piscataway, NJ USA: Institute of Electrical and Electronics Engineers. doi: 10.1109/igarss52108.2023.10282230
Seasonal dynamics of fallow and cropping lands in the broadacre cropping region of Australia
Xie, Zunyi, Zhao, Yan, Jiang, Ruizhu, Zhang, Miao, Hammer, Graeme, Chapman, Scott, Brider, Jason and Potgieter, Andries B. (2024). Seasonal dynamics of fallow and cropping lands in the broadacre cropping region of Australia. Remote Sensing of Environment, 305 114070, 1-14. doi: 10.1016/j.rse.2024.114070
Potgieter, A. B., Camino, C., Poblete, T., Zhi, X., Reynolds-Massey-Reed, S., Zhao, Y., Belwalkar, A., Ruizhu, J., George-Jaeggli, B., Chapman, S., Jordan, D., Wu, A., Hammer, G. L. and J, Zarco-Tejada P. (2023). Advances in the study of biochemical, morphological and physiological traits of wheat and sorghum crops in australia using hyperspectral data and machine learning. 2023 IEEE International Geoscience and Remote Sensing Symposium, Pasadena, CA USA, 16-21 July 2023. Piscataway, NJ USA: Institute of Electrical and Electronics Engineers. doi: 10.1109/igarss52108.2023.10282230