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An Integrated Raman Microscope and in situ STM-TEM Analysis System (2008–2009)

Abstract:
The proposed Raman microscope integrated with scanning electron microscopy (SEM) and a structural and chemical analyser will be an outstanding characterisation system for a wide range of materials, capable of structural, elemental, morphological, and physical characterization of the same sample region under precisely controlled conditions. The in-situ TEM holder will allow in-situ STM sample characterisations that will provide invaluable information on electrical properties and dynamic processes at specific locations. As a coordinated facility, these instruments represent a comprehensive characterisation tool underpinning the work of excellent researchers in advanced nano-materials, polymers, and biological systems.
Grant type:
ARC Linkage Infrastructure, Equipment and Facilities
Researchers:

  • Emeritus Professor Jin Zou

    Emeritus Professor
    School of Mechanical and Mining Engineering
    Faculty of Engineering, Architecture and Information Technology

  • Professor Ian Gentle

    Professor
    School of Chemistry and Molecular Biosciences
    Faculty of Science

  • Professor Darren Martin

    Professor
    School of Chemical Engineering
    Faculty of Engineering, Architecture and Information Technology

  • Professor John Zhu

    Professor
    School of Chemical Engineering
    Faculty of Engineering, Architecture and Information Technology
Funded by:
Australian Research Council